The latest software update to the Olympus CIX100 Cleanliness detection system includes a new microscope mode, providing component manufacturers with an all-in-one imaging solution for particle analysis and microscopy.
Optimized autofocus routines and optional overview scans in VERSION 1.5 of CIX software speed up automated analysis, making it easier to quickly deliver repeatable results. The new microscopic mode allows users to move away from the dedicated cleanliness detection workflow to perform microscopic imaging for other applications. The system is a turnkey solution for technology cleanliness detection with a guided workflow, analytical tools, and integrated industry standards.
The microscope mode feature can be expanded into an optional set of materials analysis solutions, allowing users to customize the system to their needs.
This update integrates a simplified workflow for regular cleaning applications that do not require an overview scan. Users can benefit from fast scanning with disable options, as well as enhanced autofocus and fiber sorting.
The new system provides CIX version 1.5 software and Microsoft SQL Server 2017.Now the system supports ASTM E1216-11 standard, including SCI calculation.
