Texas Instruments' ADC12DL3200 is a radio frequency sampling, gigabit sampling ADC, which will directly sample the input frequency from DC to more than 10GHz. The device can sample up to 3200MSPS in dual channel mode and up to 6400MSPS in single channel mode. Programmable trade-offs between the number of channels (dual-channel mode) and Nyquist bandwidth (single-channel mode) enable the development of flexible hardware that meets the needs of high-channel-count or wide-ranging transient signal bandwidth applications. 8GHz full power input bandwidth (–3dB) and available frequency range enable frequency agile systems to directly RF sample L-band, S-band, C-band and X-band.
The device uses a low-latency LVDS interface when latency-sensitive applications or the simplicity of LVDS is preferred. The interface uses up to 48 data pairs, 4 DDR clocks, and 4 strobe signals arranged in 4 12-bit data buses. The interface supports signaling rates up to 1.6Gbps. Strobe signals simplify synchronization between buses and between multiple devices. The strobe signal is generated internally and can be reset via the SYSREF input within a certain time. Innovative synchronization features such as noise-free aperture delay (TAD) adjustments and SYSREF windows further simplify multi-device synchronization.
